Sparse-angle X-ray Computed Tomography (CT) plays a vital role in industrial quality control but leads to an inherent trade-off between scan time and reconstruction quality. Adaptive angle selection strategies try to improve upon this based on the idea that the geometry of the object under investigation leads to an uneven distribution of the information content over the projection angles. Deep Reinforcement Learning (DRL) has emerged as an effective approach for adaptive angle selection in X-ray CT. While previous studies focused on optimizing generic image quality measures using a fixed number of angles, our work extends them by considering a specific downstream task, namely image-based defect detection, and introducing flexibility in the number of angles used. By leveraging prior knowledge about typical defect characteristics, our task-adaptive angle selection method, adaptable in terms of angle count, enables easy detection of defects in the reconstructed images.

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doi.org/10.3390/jimaging10090208
Journal of Imaging
Enabling X-ray CT based Industry 4.0 process chains by training Next Generation research expert
Centrum Wiskunde & Informatica, Amsterdam (CWI), The Netherlands

Wang, T., Florian, V., Schielein, R., Kretzer, C., Kasperl, S., Lucka, F., & van Leeuwen, T. (2024). Task-adaptive angle selection for computed tomography-based defect detection. Journal of Imaging, 10(9), 208:1–208:20. doi:10.3390/jimaging10090208