Combined STEM-EDS tomography of nanowire structures
Semiconductor Science and Technology , Volume 34 - Issue 11
The 3D spatial resolution, the material contrast and the evolution of the noise are analyzed in the reconstructed volume of a combined scanning transmission electron microscopy (HAADF-STEM) and energy dispersive x-ray spectroscopy (EDS) tomography experiment. Standard simultaneous iterative reconstruction technique and HAADF-EDS bimodal tomographic reconstruction are considered for the +/-90° tomography series of a pillar shaped sample embedding a full nanowire device. With a high number of iterations, a spatial resolution for both HAADF and EDS down to 5 nanometer can be reached for this volume. Best material's contrast and minimum noise are obtained for medium number of iterations. Improvement of the signal-to-noise and contrast can be obtained by filtering the EDS data while the spatial resolution is not impacted. A fast and reliable preparation methodology for rectangularly shaped pillar samples for tomography analysis is discussed.
|EDS tomography, HEBT tomography reconstruction, nanowire device, pillar tomography sample, STEM tomography|
|Thermo Fisher Scientific, Eindhoven, The Netherlands|
|Semiconductor Science and Technology|
|Organisation||Centrum Wiskunde & Informatica, Amsterdam, The Netherlands|
Bender, H, Richard, O, Kundu, P, Favia, P, Zhong, Z, Palenstijn, W.J, … Schoenmakers, R. (2019). Combined STEM-EDS tomography of nanowire structures. Semiconductor Science and Technology, 34(11). doi:10.1088/1361-6641/ab4840