Automated multi-modal tomography for sub-22nm IC nodes November 2014 - October 2018
Collection
Collection
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3D imaging of semiconductor components by discrete laminography In Proceedings
K.J. Batenburg (Joost), W.J. Palenstijn (Willem Jan) and J. Sijbers (Jan)
January 2014
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Aligning Projection Images from Binary Volumes Article
Fundamenta Informaticae, 135(1), 21-42.F. Bleichrodt (Folkert), J. De Beenhouwer (Jan), J. Sijbers (Jan) and K.J. Batenburg (Joost)
January 2014
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May 2014
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The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography Article
Ultramicroscopy, 35-47.W. van Aarle (Wim), W.J. Palenstijn (Willem Jan), J. De Beenhouwer (Jan), T. Altantzis (Thomas), S. Bals (Sara), K.J. Batenburg (Joost) and J. Sijbers (Jan)
January 2015
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Dirac directional emission in anisotropic zero refractive index photonic crystals Article
Nature Scientific ReportsX. He (Xin-Tao), Y. Zhong (Yao-Nan), Y. Zhou (You), Z. Zhong (Zhichao) and J. Dong (Jian-Wen)
August 2015
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Combination of HAADF-STEM and ADF-STEM Tomography for Core–Shell Hybrid Materials Article
Particle & Particle Systems Characterization, 32(12), 1063-1067.K. Sentosun, M.N. Sanz Ortiz, K.J. Batenburg (Joost), L.M. Liz-Marzán (Luis) and S. Bals (Sara)
December 2015
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Quantitative 3D analysis of huge nanoparticle assemblies Article
Nanoscale, 8(1), 292-299.D. Zanaga, F. Bleichrodt (Folkert), T. Atlantzis, N. Winckelmans (Naomi), W.J. Palenstijn (Willem Jan), J. Sijbers (Jan), B. de Nijs, M.A. van Huis, A. Sánchez-Iglesias (Ana), L.M. Liz-Marzán (Luis), et al. A. van Blaaderen (Alfons), K.J. Batenburg (Joost), S. Bals (Sara) and G. van Tendeloo
January 2016
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Fast and flexible X-ray tomography using the ASTRA toolbox Article
Optics Express, 24(22), 25129-25147.W. van Aarle (Wim), W.J. Palenstijn (Willem Jan), J. Cant (Jeroen), E. Janssens (Eline), F. Bleichrodt (Folkert), A. Dabravolski (Andrei), J. De Beenhouwer (Jan), K.J. Batenburg (Joost) and J. Sijbers (Jan)
October 2016