Nanoparticle assemblies can be investigated in 3 dimensions using electron tomography. However, it is not straightforward to obtain quantitative information such as the number of particles or their relative position. This becomes particularly difficult when the number of particles increases. We propose a novel approach in which prior information on the shape of the individual particles is exploited. It improves the quality of the reconstruction of these complex assemblies significantly. Moreover, this quantitative Sparse Sphere Reconstruction approach yields directly the number of particles and their position as an output of the reconstruction technique, enabling a detailed 3D analysis of assemblies with as many as 10 000 particles. The approach can also be used to reconstruct objects based on a very limited number of projections, which opens up possibilities to investigate beam sensitive assemblies where previous reconstructions with the available electron tomography techniques failed.
Additional Metadata
THEME Computation (theme 10)
Publisher The Royal Society of Chemistry
Persistent URL dx.doi.org/10.1039/c5nr06962a
Journal Nanoscale
Project Automated multi-modal tomography for sub-22nm IC nodes
Grant This work was funded by the The Netherlands Organisation for Scientific Research (NWO); grant id nwo/13314 - Automated multi-modal tomography for sub-22nm IC nodes
Citation
Zanaga, D, Bleichrodt, F, Atlantzis, T, Winckelmans, N, Palenstijn, W.J, Sijbers, J, … van Tendeloo, G. (2016). Quantitative 3D analysis of huge nanoparticle assemblies. Nanoscale, 8(1), 292–299. doi:10.1039/c5nr06962a