Practical error bounds for binary tomography

2013-01-01

Presented at the International Conference on Tomography of Materials and Structures, Ghent, Belgium

Additional Metadata
THEME	Life Sciences (theme 5), Information (theme 2)
Conference	International Conference on Tomography of Materials and Structures
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Fortes, W.R, Sijbers, J, & Batenburg, K.J. (2013). Practical error bounds for binary tomography. In Proceedings of International Conference on Tomography of Materials and Structures 2013 (ICTMS 0) (pp. 97–100).

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