vandriiashen /mc-scattering

Application based on GATE to simulate scattering in X-ray imaging .

Additional Metadata
Rights	GNU General Public License v3.0
Organisation	Computational Imaging
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Andriiashen, V. (2023). vandriiashen /mc-scattering.

Additional Files
View at GitHub

See Also
techReport Quantifying the effect of X-ray scattering for data generation in real-time defect detection V. Andriiashen (Vladyslav), R. van Liere (Robert), T. van Leeuwen (Tristan) and K.J. Batenburg (Joost)
article Quantifying the effect of X-ray scattering for data generation in real-time defect detection V. Andriiashen (Vladyslav), R. van Liere (Robert), T. van Leeuwen (Tristan) and K.J. Batenburg (Joost)

Publication