Novel approaches for electron tomography to investigate the structure and stability of nanomaterials in 3 dimensions

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Persistent URL	doi.org/10.1017/S1431927620017031
Journal	Microscopy and Microanalysis
Organisation	Centrum Wiskunde & Informatica, Amsterdam (CWI), The Netherlands
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Bals, S., Albrecht, W., Vanrompay, H., Bladt, E., Skorikov, A., De Oliveira, T. M., … van Aert, S. (2020). Novel approaches for electron tomography to investigate the structure and stability of nanomaterials in 3 dimensions. Microscopy and Microanalysis, 26(2), 1128–1130. doi:10.1017/S1431927620017031

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