doi.org/10.1017/S1431927620017031
Microscopy and Microanalysis
Centrum Wiskunde & Informatica, Amsterdam (CWI), The Netherlands

Bals, S., Albrecht, W., Vanrompay, H., Bladt, E., Skorikov, A., De Oliveira, T. M., … van Aert, S. (2020). Novel approaches for electron tomography to investigate the structure and stability of nanomaterials in 3 dimensions. Microscopy and Microanalysis, 26(2), 1128–1130. doi:10.1017/S1431927620017031