dx.doi.org/10.1017/S1431927620017031
Microscopy and Microanalysis
Centrum Wiskunde & Informatica, Amsterdam, The Netherlands

Bals, S, Albrecht, W, Vanrompay, H, Bladt, E, Skorikov, A, De Oliveira, T.M, … van Aert, S. (2020). Novel approaches for electron tomography to investigate the structure and stability of nanomaterials in 3 dimensions. Microscopy and Microanalysis. doi:10.1017/S1431927620017031