Novel approaches for electron tomography to investigate the structure and stability of nanomaterials in 3 dimensions

2020

Microscopy and Microanalysis , Volume 26 - Issue 2 p. 1128- 1130

Additional Metadata
Persistent URL	doi.org/10.1017/S1431927620017031
Journal	Microscopy and Microanalysis
Organisation	Centrum Wiskunde & Informatica, Amsterdam (CWI), The Netherlands
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Bals, S, Albrecht, W, Vanrompay, H, Bladt, E, Skorikov, A, De Oliveira, T.M, … van Aert, S. (2020). Novel approaches for electron tomography to investigate the structure and stability of nanomaterials in 3 dimensions. Microscopy and Microanalysis, 26(2), 1128–1130. doi:10.1017/S1431927620017031

Publication