X-ray orientation microscopy using topo-tomography and multi-mode diffraction contrast tomography
Current Opinion in Solid State and Materials Science , Volume 24 - Issue 4 p. 100832
Polycrystal orientation mapping techniques based on full-field acquisition schemes like X-ray Diffraction Contrast Tomography and certain other variants of 3D X-ray Diffraction or near-field High Energy Diffraction Microscopy enable time efficient mapping of 3D grain microstructures. The spatial resolution obtained with this class of monochromatic beam X-ray diffraction imaging approaches remains typically below the ultimate spatial resolution achievable with X-ray imaging detectors. Introducing a generalised reconstruction framework enabling the combination of acquisitions with different detector pixel size and sample tilt settings provide a pathway towards 3D orientation mapping with a spatial resolution approaching the one of state of the art X-ray imaging detector systems.
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|Current Opinion in Solid State and Materials Science|
|Organisation||Centrum Wiskunde & Informatica, Amsterdam (CWI), The Netherlands|
Viganò, N.R, & Ludwig, W. (2020). X-ray orientation microscopy using topo-tomography and multi-mode diffraction contrast tomography. Current Opinion in Solid State and Materials Science, 24(4). doi:10.1016/j.cossms.2020.100832