Reducing the Cost of Grammar-Based Testing Using Pattern Coverage

2015-01-01

Presented at the IFIP International Conference on Testing Software and Systems, Dubai

Additional Metadata
THEME	Software (theme 1)
Publisher	Springer
Conference	IFIP International Conference on Testing Software and Systems
Note	Published paper: DOI: 10.1007/978-3-319-25945-1_5
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Hentz, C, Vinju, J.J, & Moreira, A.M. (2015). Reducing the Cost of Grammar-Based Testing Using Pattern Coverage. In Proceedings of IFIP International Conference on Testing Software and Systems 2015 (ICTSS 0). Springer.

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