Additional Metadata
THEME Software (theme 1)
Publisher Springer
Conference IFIP International Conference on Testing Software and Systems
Note Published paper: DOI: 10.1007/978-3-319-25945-1_5
Citation
Hentz, C, Vinju, J.J, & Moreira, A.M. (2015). Reducing the Cost of Grammar-Based Testing Using Pattern Coverage. In Proceedings of IFIP International Conference on Testing Software and Systems 2015 (ICTSS 0). Springer.