Measuring Lattice Strain in Three Dimensions through Electron Microscopy
Nano Letters , Volume 15 - Issue 10 p. 6996- 7001
The three-dimensional (3D) atomic structure of nanomaterials, including strain, is crucial to understand their properties. Here, we investigate lattice strain in Au nanodecahedra using electron tomography. Although different electron tomography techniques enabled 3D characterizations of nanostructures at the atomic level, a reliable determination of lattice strain is not straightforward. We therefore propose a novel model-based approach from which atomic coordinates are measured. Our findings demonstrate the importance of investigating lattice strain in 3D.
|Keywords||Atomic resolution, electron tomography, Au nanodecahedron, 3D lattice strain|
|THEME||Energy (theme 4)|
|Publisher||American Chemical Society|
|Project||Quantitative electron tomography by simultaneous parameter estimation and reconstruction|
Goris, B, De Beenhouwer, J, de Backer, A, Zanaga, D, Batenburg, K.J, Sánchez-Iglesias, A, … van Tendeloo, G. (2015). Measuring Lattice Strain in Three Dimensions through Electron Microscopy. Nano Letters, 15(10), 6996–7001. doi:10.1021/acs.nanolett.5b03008