Total variation minimization approach in in-line X-ray phase-contrast tomography

2013-01-01

Optics Express , Volume 21 - Issue 10 p. 12185- 12196

Additional Metadata
THEME	Life Sciences (theme 5), Information (theme 2)
Journal	Optics Express
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Kostenko, A, Batenburg, K.J, King, A, Offerman, S.E, & van Vliet, L.J. (2013). Total variation minimization approach in in-line X-ray phase-contrast tomography. Optics Express, 21(10), 12185–12196.

Publication