Accurate Measurement of Shape at Low Resolution

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Editor	L.N. Kanal , E.S. Gelsema
Conference	Machine Intelligence and Pattern Recognition
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Smeulders, A., & Worring, M. (1988). Accurate Measurement of Shape at Low Resolution. In L. N. Kanal & E. S. Gelsema (Eds.), Machine Intelligence and Pattern Recognition (pp. 91–102).

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