Field of inserted charges during Scanning Electron Microscopy of non-conducting samples

2011-11-01

Presented at the Workshop Physics with Industry , Leiden

Additional Metadata
THEME	Energy (theme 4)
Publisher	Stichting FOM/Lorentz Center Leiden
Conference	Workshop Physics with Industry
Organisation	Multiscale Dynamics
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Amlaki, T., Budko, N., Bosch, E., Debernardi, N., Ebert, U., Leung, V., … Thijssen, J. (2011). Field of inserted charges during Scanning Electron Microscopy of non-conducting samples. In Proceedings of Workshop Physics with Industry 2011 (pp. 17–31). Stichting FOM/Lorentz Center Leiden.

See Also
inProceedings Protecting high frequency IC's from electrostatic discharge U. Ebert (Ute), J. Frenken, H. van der Graaf, N. Hermosa, S. Hofmann, G.M.W. Kroesen, C. Li (Chao), D. Makogon, M. Ranjan, P. Steeneken, et al. O. Wunnicke
inProceedings Protecting high frequency IC's from electrostatic discharge U. Ebert (Ute), J. Frenken, H. van der Graaf, N. Hermosa, S. Hofmann, G.M.W. Kroesen, C. Li (Chao), D. Makogon, M. Ranjan, P. Steeneken, et al. O. Wunnicke

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