Optical Tracking Using Projective Invariant Marker Pattern Properties

Additional Metadata
Publisher	IEEE
Conference	IEEE Virtual Reality
Organisation	Visualization and 3D User Interfaces
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	van Liere, R., & Mulder, J. C. (2003). Optical Tracking Using Projective Invariant Marker Pattern Properties. In Proceedings of the IEEE Virtual Reality 2003 (pp. 191–199). IEEE.

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