2000
Fractal transforms and feature invariance
Publication
Publication
Presented at the
International Conference on Pattern Recognition, Barcelona, Spain
In this paper, fractal transforms are employed with the aim of image recognition. It is known that such transforms are highly sensitive to distortions like a small shift of an image. However, by using features based on statistics kept during the actual decomposition we can derive features from fractal transforms, which are invariant to perturbations like rotation, translation, folding or contrast scaling. Further, we introduce a feature invariance measure, which reveals the degree of invariance of a feature with respect to a database. The features and the way their invariance is measured, appear well suited for the application to images of textures.
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IEEE | |
Proceedings IEEE International Symposium on Information Theory (ISIT) | |
International Conference on Pattern Recognition | |
Organisation | Signals and Images |
Schouten, B., & de Zeeuw, P. (2000). Fractal transforms and feature invariance. In Proceedings of 15th International Conference on Pattern Recognition 2000. IEEE. |