Definition of methods for automated test generation for TTCN3 based test systems

2005

Additional Metadata
Series	TT-Medal
Organisation	Specification and Analysis of Embedded Systems
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Calamé, J., Ru Dai, Z., Ioustinova, N., van de Pol, J., & Swinkels, R. (2005). Definition of methods for automated test generation for TTCN3 based test systems. TT-Medal.

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