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K.J. Batenburg (Joost), J. Jinschek, H. Calderon and C. Kisielowski

2006

Incorporating prior knowledge for atomic resolution discrete tomography

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Microscopy and Microanalysis , Volume 12 p. 1572- 1573

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THEME Software (theme 1)
Publisher Cambridge University Press
Journal Microscopy and Microanalysis
Organisation Cryptology
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Batenburg, J., Jinschek, J., Calderon, H., & Kisielowski, C. (2006). Incorporating prior knowledge for atomic resolution discrete tomography. Microscopy and Microanalysis, 12, 1572–1573.

See Also
article
3D Imaging of nanomaterials by discrete tomography
K.J. Batenburg (Joost), U. Kaiser and C. Kübel
article
3D Imaging of nanomaterials by discrete tomography
K.J. Batenburg (Joost), U. Kaiser and C. Kübel

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