2005
Bit boundary testing coverage
Publication
Publication
Presented at the
Canadian Conference on Electrical and Computer Engineering , Saskatoon, Saskatchewan Canada
In L. Fejis et al. (2002) we proposed a general framework for defining a coverage measure based on a distance measure between different behaviors of a system under test and in N. Goga and F. Moldoveanu coverage formulas were given for the boundary bit value analyse test selection. On the current paper we instantiate these formulas for the data types of the ASN standard on which several standards are based, such as the TTCN-3 standard
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| IEEE | |
| Canadian Conference on Electrical and Computer Engineering | |
| Organisation | Specification and Analysis of Embedded Systems |
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Goga, N., & Moldoveanu, F. (2005). Bit boundary testing coverage. In Proceedings of Canadian Conference on Electrical and Computer Engineering 2005 (18) (pp. 408–411). IEEE. |
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