Automatic Model-Based Generation of Parameterized Test Cases Using Data Abstraction

2007-10-01

Presented at the Doctoral Symposium of IFM, Eindhoven, The Netherlands

Additional Metadata
ACM	Requirements/Specifications (acm D.2.1), Testing and Debugging (acm D.2.5)
Publisher	Elsevier
Editor	J.M.T. Romijn (Judi) , G.S.B. Smith (Graeme) , J.C. van de Pol (Jaco)
Journal	Electronic Notes in Theoretical Computer Science
Project	Protocols for Secure Infrastructure and E-commerce
Conference	Doctoral Symposium of IFM
Note	Part of International Conference on Integrated Formal Methods (IFM)
Organisation	Specification and Analysis of Embedded Systems
Citation APA Style AAA Style APA Style Cell Style Chicago Style Harvard Style IEEE Style MLA Style Nature Style Vancouver Style American-Institute-of-Physics Style Council-of-Science-Editors Style BibTex Format Endnote Format RIS Format CSL Format DOIs only Format	Calamé, J., Ioustinova, N., & van de Pol, J. (2007). Automatic Model-Based Generation of Parameterized Test Cases Using Data Abstraction. In J. Romijn, G. Smith, & J. van de Pol (Eds.), Electronic Notes in Theoretical Computer Science (Vol. 191, pp. 25–48). Elsevier.

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