Particle & Particle Systems Characterization
Collection
Collection
- ISSN: 1521-4117
Published by Wiley
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Combination of HAADF-STEM and ADF-STEM Tomography for Core–Shell Hybrid Materials Article
Particle & Particle Systems Characterization, 32(12), 1063-1067.K. Sentosun, M.N. Sanz Ortiz, K.J. Batenburg (Joost), L.M. Liz-Marzán (Luis) and S. Bals (Sara)
December 2015
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Artifact reduction based on sinogram interpolation for the 3D reconstruction of nanoparticles using electron tomography Article
Particle & Particle Systems Characterization, 34(12)K. Sentosun, I. Lobato (Ivan), E. Bladt (Eva), Y. Zhang (Yang), W.J. Palenstijn (Willem Jan), K.J. Batenburg (Joost), D. Van Dyck (Dirk) and S. Bals (Sara)
October 2017 -
Real-Time Reconstruction of Arbitrary Slices for Quantitative and In Situ 3D Characterization of Nanoparticles Article
Particle & Particle Systems Characterization, 37(7)H. Vanrompay (Hans), J. Buurlage (Jan-Willem), D.M. Pelt (Daniël), V. Kumar (Vished), X. Zhuo (Xiaolu), L.M. Liz-Marzán (Luis), S. Bals (Sara) and K.J. Batenburg (Joost)
July 2020